Stochastic excitation for high-resolution atomic force acoustic microscopy imaging: a system theory approach

• Edgar Cruz Valeriano,
• José Juan Gervacio Arciniega,
• Christian Iván Enriquez Flores,
• Susana Meraz Dávila,
• Joel Moreno Palmerin,
• Martín Adelaido Hernández Landaverde,
• Yuri Lizbeth Chipatecua Godoy,
• Aime Margarita Gutiérrez Peralta,
• Rafael Ramírez Bon and
• José Martín Yañez Limón

Beilstein J. Nanotechnol. 2020, 11, 703–716, doi:10.3762/bjnano.11.58

• Guanajuato. Ex Hacienda San Matías s/n C.P. 36020. Guanajuato, Guanajuato, México 10.3762/bjnano.11.58 Abstract In this work, a high-resolution atomic force acoustic microscopy imaging technique is developed in order to obtain the local indentation modulus at the nanoscale level. The technique uses a model

• frequency resolution, with less computational cost and at a faster speed than other similar techniques. This technique is referred to as stochastic atomic force acoustic microscopy (S-AFAM), and the frequency shifts of the free resonance frequencies of an AFM cantilever are used to determine the mechanical

• properties of a material. S-AFAM is implemented and compared with a conventional technique (resonance tracking-atomic force acoustic microscopy, RT-AFAM). A sample of a graphite film on a glass substrate is analyzed. S-AFAM can be implemented in any AFM system due to its reduced instrumentation requirements

Atomic force acoustic microscopy reveals the influence of substrate stiffness and topography on cell behavior

• Yan Liu,
• Li Li,
• Xing Chen,
• Ying Wang,
• Meng-Nan Liu,
• Jin Yan,
• Liang Cao,
• Lu Wang and
• Zuo-Bin Wang

Beilstein J. Nanotechnol. 2019, 10, 2329–2337, doi:10.3762/bjnano.10.223

• the cell–substrate interface are two key properties influencing cell behavior. In this paper, atomic force acoustic microscopy (AFAM) is used to investigate the influence of substrate stiffness and substrate topography on the responses of L929 fibroblasts. This combined nondestructive technique is

• for the tissue regeneration therapy in biomedicine. Keywords: atomic force acoustic microscopy (AFAM); cell growth; nanopattern; stiffness; SU-8 photoresist; topography; Introduction The interactions of cells with extracellular matrices (ECMs) play important roles in regenerative medicine and tissue

• biomechanical studies [21]. Atomic force acoustic microscopy (AFAM) is a technique based on AFM for nondestructive imaging. This technique operates on a dynamic mode in which the AFM cantilever vibrates upon ultrasound excitation. Accordingly, AFAM shows the ability to measure nanomechanical properties and is

Subsurface imaging of flexible circuits via contact resonance atomic force microscopy

• Wenting Wang,
• Chengfu Ma,
• Yuhang Chen,
• Lei Zheng,
• Huarong Liu and
• Jiaru Chu

Beilstein J. Nanotechnol. 2019, 10, 1636–1647, doi:10.3762/bjnano.10.159

• advantages of easy operation and no special requirements for the tip and sample. In this method, the tip–sample contact is modulated with ultrasonic vibrations and the contact resonance of the AFM probe is monitored while scanning in contact mode. CR-AFM was started from the so-called atomic force acoustic

• microscopy where the sample is ultrasonically excited at a specified frequency and the amplitude and phase of the cantilever are recorded [13][14]. After that, the theoretical analysis of the cantilever vibration with the tip contacting the sample surface was intensively investigated, including the influence

A robust AFM-based method for locally measuring the elasticity of samples

• Alexandre Bubendorf,
• Stefan Walheim,
• Thomas Schimmel and
• Ernst Meyer

Beilstein J. Nanotechnol. 2018, 9, 1–10, doi:10.3762/bjnano.9.1

• on the equations established by Rabe [9] and Rabe et al. [10] for atomic force acoustic microscopy (AFAM) [11][12][13][14]. They describe the dynamics of a clamped cantilever elastically coupled with the sample surface at its tip end. These equations have the disadvantage of strongly depending on the

Advanced atomic force microscopy techniques III

• Thilo Glatzel and
• Thomas Schimmel

Beilstein J. Nanotechnol. 2016, 7, 1052–1054, doi:10.3762/bjnano.7.98

• Eva Roblegg and co-workers [20]. The local elastic stiffness and damping of individual phases in a titanium alloys was measured by using atomic force acoustic microscopy (AFAM) and mapping of contact-resonance spectra [21]. Another alloy, namely a Pt containing metallic glass, was characterized by AFM

Mapping of elasticity and damping in an α + β titanium alloy through atomic force acoustic microscopy

• M. Kalyan Phani,
• Anish Kumar,
• T. Jayakumar,
• Walter Arnold and
• Konrad Samwer

Beilstein J. Nanotechnol. 2015, 6, 767–776, doi:10.3762/bjnano.6.79

• . Physikalisches Institut, Georg-August-Universität, Friedrich Hund Platz 1, D-37077 Göttingen, Germany 10.3762/bjnano.6.79 Abstract The distribution of elastic stiffness and damping of individual phases in an α + β titanium alloy (Ti-6Al-4V) measured by using atomic force acoustic microscopy (AFAM) is reported

• microscopy (AFM) techniques, such as ultrasonic atomic force microscopy (UAFM) [3], and atomic force acoustic microscopy [4] have emerged for the characterization of elastic properties of materials with nanometer resolution. UAFM and AFAM work with a similar principle and only vary in the excitation of the

• β-phases in the specimens heat-treated at different temperatures. The study also demonstrates that the micro-scale elastic properties measured by using AFAM can also be used for obtaining the average elastic properties of the bulk samples. Schematic setup of atomic force acoustic microscopy

Frequency, amplitude, and phase measurements in contact resonance atomic force microscopies

• Gheorghe Stan and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2014, 5, 278–288, doi:10.3762/bjnano.5.30

• dynamic AFM modes. Within the force modulation method [2], the tip and the sample are brought into contact at a prescribed tip–sample force setpoint (cantilever deflection setpoint, as in contact mode imaging) and the sample is excited with a sinusoidal oscillation in the vertical direction (atomic force

• acoustic microscopy (AFAM) configuration [3]), such that the tip oscillation amplitude and its phase with respect to the excitation can be measured and converted into a loss and storage modulus. In contact resonance AFM (CR-AFM) [3][4][5][6][7][8][9] a similar setup is used, supplying the sinusoidal